Tech Xplore on MSN

Overparameterized neural networks: Feature learning precedes overfitting, research finds

Modern neural networks, with billions of parameters, are so overparameterized that they can "overfit" even random, ...
Semiconductor Engineering

AI Meets Device Modeling: Transforming Compact Modeling With Machine Learning

As semiconductor technologies advance, device structures are becoming increasingly complex. New materials and architectures introduce intricate physical effects requiring accurate modeling to ensure ...
EurekAlert!

Rohan Chand Sahu from Indian Institute of Technology (IIT) explores AI-powered nanomedicine: Machine learning redefines precision cancer drug delivery

This review systematically examines the integration of machine learning (ML) and artificial intelligence (AI) in nanomedicine ...
Aviation Today

Second EASA Joint Report Explains Key Elements of W Development Model for Machine Learning Avionics Software

The European Union Aviation Safety Agency (EASA) and Daedalean published their second joint report Concepts of Design Assurance for Neural Networks (CoDANN) II, on May 21 to explain key machine ...
EurekAlert!

Optimizing sepsis treatment timing with a machine learning model

COLUMBUS, Ohio – A new machine learning model that estimates optimal treatment timing for sepsis could pave the way for support tools that help physicians personalize treatment decisions at the ...
The American Journal of Managed Care

Multitask Learning Model Outperforms Traditional Machine Learning Models in RCTs, Developers Say

The proposed multitask learning (MTL) model was developed using data from wearable devices worn by individuals in a randomized controlled trial (RCT) to predict outcomes of a depression treatment.